Yumin Suh, Bohyung Han, Wonsik Kim, Kyoung Mu Lee. Stochastic Class-Based Hard Example Mining for Deep Metric Learning. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 7251-7259, Computer Vision Foundation / IEEE, 2019. [doi]
@inproceedings{SuhHKL19,
title = {Stochastic Class-Based Hard Example Mining for Deep Metric Learning},
author = {Yumin Suh and Bohyung Han and Wonsik Kim and Kyoung Mu Lee},
year = {2019},
url = {http://openaccess.thecvf.com/content_CVPR_2019/html/Suh_Stochastic_Class-Based_Hard_Example_Mining_for_Deep_Metric_Learning_CVPR_2019_paper.html},
researchr = {https://researchr.org/publication/SuhHKL19},
cites = {0},
citedby = {0},
pages = {7251-7259},
booktitle = {IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019},
publisher = {Computer Vision Foundation / IEEE},
}