Yumin Suh, Bohyung Han, Wonsik Kim, Kyoung Mu Lee. Stochastic Class-Based Hard Example Mining for Deep Metric Learning. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 7251-7259, Computer Vision Foundation / IEEE, 2019. [doi]
Abstract is missing.