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Identification of the White-Mold affected Soybean fields by using Multispectral Imageries, Spatial Autocorrelation and Support Vector Machine

Sae-han Suh, Dong Youn Kim, Ji-eun Jhang, Emmanuel Byamukama, Gary Hatfield, Sung Y. Shin. Identification of the White-Mold affected Soybean fields by using Multispectral Imageries, Spatial Autocorrelation and Support Vector Machine. In Proceedings of the International Conference on Research in Adaptive and Convergent Systems, RACS 2017, Krakow, Poland, September 20-23, 2017. pages 104-109, ACM, 2017. [doi]

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