Sungho Suh, Haebom Lee, Tae Yeob Kang. Fault Diagnosis of Indium Tin Oxide Electrodes by Multi-channel S-parameter Patterns. In International Conference on Electronics, Information, and Communication, ICEIC 2024, Taipei, Taiwan, January 28-31, 2024. pages 1-4, IEEE, 2024. [doi]
Abstract is missing.