E. Suhir, A. Bensoussan, G. Khatibi, Johann Nicolics. Probabilistic design for reliability in electronics and photonics: Role, significance, attributes, challenges. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 5, IEEE, 2015. [doi]
No references recorded for this publication.
No citations of this publication recorded.