E. Suhir - researchr alias

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Viewing Publication 1 - 8 from 8

2015

A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validationA. Bensoussan, E. Suhir, P. Henderson, M. Zahir. mr, 55(9-10):1729-1735, 2015. [doi]

Probabilistic design for reliability in electronics and photonics: Role, significance, attributes, challengesE. Suhir, A. Bensoussan, G. Khatibi, Johann Nicolics. irps 2015: 5 [doi]

2014

Thermal stress in through-silicon-vias: Theory-of-elasticity approachE. Suhir. mr, 54(5):972-977, 2014. [doi]

Three-step concept (TSC) in modeling microelectronics reliability (MR): Boltzmann-Arrhenius-Zhurkov (BAZ) probabilistic physics-of-failure equation sandwiched between two statistical modelsE. Suhir. mr, 54(11):2594-2603, 2014. [doi]

2013

Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testingE. Suhir, L. Béchou. mr, 53(9-11):1506-1509, 2013. [doi]

2012

When adequate and predictable reliability is imperativeE. Suhir. mr, 52(9-10):2342-2346, 2012. [doi]

2010

Elastizitätsmodell eines keramischen Sensorstreifens bei longitudinaler VerformungW. Gschohsmann, Johann Nicolics, E. Suhir. ei, 127(10):279-284, 2010. [doi]

2007

Response of a heavy electronic component to harmonic excitations applied to its external electric leadsE. Suhir. ei, 124(9):309-314, 2007. [doi]

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