A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation

A. Bensoussan, E. Suhir, P. Henderson, M. Zahir. A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation. Microelectronics Reliability, 55(9-10):1729-1735, 2015. [doi]

Abstract

Abstract is missing.