Valeriy Sukharev, Armen Kteyan, Farid N. Najm, Yong Hyeon Yi, Chris H. Kim, Jun-Ho Choy, Sofya Torosyan, Yu Zhu. Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(11):4837-4850, 2022. [doi]
@article{SukharevKNYKCTZ22,
title = {Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids},
author = {Valeriy Sukharev and Armen Kteyan and Farid N. Najm and Yong Hyeon Yi and Chris H. Kim and Jun-Ho Choy and Sofya Torosyan and Yu Zhu},
year = {2022},
doi = {10.1109/TCAD.2021.3134886},
url = {https://doi.org/10.1109/TCAD.2021.3134886},
researchr = {https://researchr.org/publication/SukharevKNYKCTZ22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {41},
number = {11},
pages = {4837-4850},
}