High Reliable Multi-View Semi-Supervised Learning with Extremely Sparse Labeled Data

Shiliang Sun. High Reliable Multi-View Semi-Supervised Learning with Extremely Sparse Labeled Data. In Fatos Xhafa, Francisco Herrera, Ajith Abraham, Mario Köppen, José Manuel Benítez, editors, 8th International Conference on Hybrid Intelligent Systems (HIS 2008), September 10-12, 2008, Barcelona, Spain. pages 935-938, IEEE Computer Society, 2008. [doi]

Abstract

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