Exploiting Process Variation and Noise in Comparators to Calibrate Interstage Gain Nonlinearity in Pipelined ADCs

Nan Sun. Exploiting Process Variation and Noise in Comparators to Calibrate Interstage Gain Nonlinearity in Pipelined ADCs. IEEE Trans. on Circuits and Systems, 59-I(4):685-695, 2012. [doi]

Abstract

Abstract is missing.