Hai Sun. On the Field Patterns in Elliptic-Shaped Microshield Lines Loaded with Left-Handed Materials by the Edge-Based Finite Element Method. In Tenth International Conference on Computational Intelligence and Security, CIS 2014, Kunming, Yunnan, China, November 15-16, 2014. pages 330-333, IEEE Computer Society, 2014. [doi]
Abstract is missing.