Youcheng Sun, Hana Chockler, Xiaowei Huang 0001, Daniel Kroening. Explaining Image Classifiers Using Statistical Fault Localization. In Andrea Vedaldi, Horst Bischof, Thomas Brox, Jan-Michael Frahm, editors, Computer Vision - ECCV 2020 - 16th European Conference, Glasgow, UK, August 23-28, 2020, Proceedings, Part XXVIII. Volume 12373 of Lecture Notes in Computer Science, pages 391-406, Springer, 2020. [doi]
Abstract is missing.