Yan Sun, Yuesheng Cao, Jinwen Li, Tiejun Li. An Efficient Model for Soft Error Vulnerability of Dynamic Circuits. In Weixia Xu, Liquan Xiao, Jinwen Li, Chengyi Zhang, Zhenzhen Zhu, editors, Computer Engineering and Technology - 21st CCF Conference, NCCET 2017, Xiamen, China, August 16-18, 2017, Revised Selected Papers. Volume 600 of Communications in Computer and Information Science, pages 133-142, Springer, 2017. [doi]
@inproceedings{SunCLL17,
title = {An Efficient Model for Soft Error Vulnerability of Dynamic Circuits},
author = {Yan Sun and Yuesheng Cao and Jinwen Li and Tiejun Li},
year = {2017},
doi = {10.1007/978-981-10-7844-6_13},
url = {https://doi.org/10.1007/978-981-10-7844-6_13},
researchr = {https://researchr.org/publication/SunCLL17},
cites = {0},
citedby = {0},
pages = {133-142},
booktitle = {Computer Engineering and Technology - 21st CCF Conference, NCCET 2017, Xiamen, China, August 16-18, 2017, Revised Selected Papers},
editor = {Weixia Xu and Liquan Xiao and Jinwen Li and Chengyi Zhang and Zhenzhen Zhu},
volume = {600},
series = {Communications in Computer and Information Science},
publisher = {Springer},
isbn = {978-981-10-7844-6},
}