Yan Sun, Yuesheng Cao, Jinwen Li, Tiejun Li. An Efficient Model for Soft Error Vulnerability of Dynamic Circuits. In Weixia Xu, Liquan Xiao, Jinwen Li, Chengyi Zhang, Zhenzhen Zhu, editors, Computer Engineering and Technology - 21st CCF Conference, NCCET 2017, Xiamen, China, August 16-18, 2017, Revised Selected Papers. Volume 600 of Communications in Computer and Information Science, pages 133-142, Springer, 2017. [doi]
Abstract is missing.