Jinghao Sun, Yaoyao Chi, Tianfei Xu, Lei Cao, Nan Guan, Zhishan Guo, Wang Yi 0001. *. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 204-209, IEEE, 2020. [doi]
@inproceedings{SunCXCGG020,
title = {*},
author = {Jinghao Sun and Yaoyao Chi and Tianfei Xu and Lei Cao and Nan Guan and Zhishan Guo and Wang Yi 0001},
year = {2020},
doi = {10.23919/DATE48585.2020.9116559},
url = {https://doi.org/10.23919/DATE48585.2020.9116559},
researchr = {https://researchr.org/publication/SunCXCGG020},
cites = {0},
citedby = {0},
pages = {204-209},
booktitle = {2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020},
publisher = {IEEE},
isbn = {978-3-9819263-4-7},
}