OAT: Attesting Operation Integrity of Embedded Devices

Zhichuang Sun, Bo Feng, Long Lu, Somesh Jha. OAT: Attesting Operation Integrity of Embedded Devices. In 2020 IEEE Symposium on Security and Privacy, SP 2020, San Francisco, CA, USA, May 18-21, 2020. pages 1433-1449, IEEE, 2020. [doi]

Authors

Zhichuang Sun

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Bo Feng

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Long Lu

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Somesh Jha

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