OAT: Attesting Operation Integrity of Embedded Devices

Zhichuang Sun, Bo Feng, Long Lu, Somesh Jha. OAT: Attesting Operation Integrity of Embedded Devices. In 2020 IEEE Symposium on Security and Privacy, SP 2020, San Francisco, CA, USA, May 18-21, 2020. pages 1433-1449, IEEE, 2020. [doi]

Abstract

Abstract is missing.