Yabin Sun, Jun Fu, Yudong Wang, Wei Zhou, Zhihong Liu, Xiaojin Li, Yanling Shi. Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT. Microelectronics Reliability, 65:41-46, 2016. [doi]
@article{SunFWZLLS16,
title = {Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT},
author = {Yabin Sun and Jun Fu and Yudong Wang and Wei Zhou and Zhihong Liu and Xiaojin Li and Yanling Shi},
year = {2016},
doi = {10.1016/j.microrel.2016.08.008},
url = {http://dx.doi.org/10.1016/j.microrel.2016.08.008},
researchr = {https://researchr.org/publication/SunFWZLLS16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {65},
pages = {41-46},
}