Hao Sun, Qing Gao 0001, Steven X. Ding, Jianbin Qiu, Jinhu Lü 0001. Two-Stage Observer-Based Fault Detection and Isolation for Re-Entrant Manufacturing Systems. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 56(4):2485-2500, April 2026. [doi]
Abstract is missing.