Electrical Parameters Degradation of E-mode GaN Under Repeated Short-Circuit Impacts - researchr publication authors

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Lei Sun, Dongqing Hu, Xintian Zhou, Meng Liu, Jie Cao. Electrical Parameters Degradation of E-mode GaN Under Repeated Short-Circuit Impacts. In EITCE 2020: 4th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, 6 November, 2020 - 8 November, 2020. pages 986-990, ACM, 2020. [doi]

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