Lei Sun, Dongqing Hu, Xintian Zhou, Meng Liu, Jie Cao. Electrical Parameters Degradation of E-mode GaN Under Repeated Short-Circuit Impacts. In EITCE 2020: 4th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, 6 November, 2020 - 8 November, 2020. pages 986-990, ACM, 2020. [doi]
@inproceedings{SunHZLC20,
title = {Electrical Parameters Degradation of E-mode GaN Under Repeated Short-Circuit Impacts},
author = {Lei Sun and Dongqing Hu and Xintian Zhou and Meng Liu and Jie Cao},
year = {2020},
doi = {10.1145/3443467.3443892},
url = {https://doi.org/10.1145/3443467.3443892},
researchr = {https://researchr.org/publication/SunHZLC20},
cites = {0},
citedby = {0},
pages = {986-990},
booktitle = {EITCE 2020: 4th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, 6 November, 2020 - 8 November, 2020},
publisher = {ACM},
isbn = {978-1-4503-8781-1},
}