Stochastic Delay Characterization for Multicoupled RLC Interconnects Under Process Variations

Jin Sun, Xin Li, Zhichao Lian, Min Li. Stochastic Delay Characterization for Multicoupled RLC Interconnects Under Process Variations. Journal of Circuits, Systems, and Computers, 28(9):1950152, 2019. [doi]

Abstract

Abstract is missing.