Development of Frequency-Mixed Point-Focusing Shear Horizontal Guided-Wave EMAT for Defect Inspection Using Deep Neural Network

Hongyu Sun, Lisha Peng, Shen Wang 0003, Songling Huang, Kaifeng Qu. Development of Frequency-Mixed Point-Focusing Shear Horizontal Guided-Wave EMAT for Defect Inspection Using Deep Neural Network. IEEE T. Instrumentation and Measurement, 70:1-14, 2021. [doi]

Abstract

Abstract is missing.