Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification

Bo Sun, Wuyang Pan, Zili Wang, Kam-Chuen Yung. Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification. Microelectronics Reliability, 55(9-10):1384-1390, 2015. [doi]

Authors

Bo Sun

This author has not been identified. Look up 'Bo Sun' in Google

Wuyang Pan

This author has not been identified. Look up 'Wuyang Pan' in Google

Zili Wang

This author has not been identified. Look up 'Zili Wang' in Google

Kam-Chuen Yung

This author has not been identified. Look up 'Kam-Chuen Yung' in Google