Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification

Bo Sun, Wuyang Pan, Zili Wang, Kam-Chuen Yung. Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification. Microelectronics Reliability, 55(9-10):1384-1390, 2015. [doi]

Abstract

Abstract is missing.