Zhilin Sun, Weifeng Sun, Yangbo Yi, Longxing Shi. Study of the power capability of LDMOS and the improved methods. Microelectronics Reliability, 46(5-6):1001-1005, 2006. [doi]
@article{SunSYS06,
title = {Study of the power capability of LDMOS and the improved methods},
author = {Zhilin Sun and Weifeng Sun and Yangbo Yi and Longxing Shi},
year = {2006},
doi = {10.1016/j.microrel.2005.07.111},
url = {http://dx.doi.org/10.1016/j.microrel.2005.07.111},
researchr = {https://researchr.org/publication/SunSYS06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {5-6},
pages = {1001-1005},
}