Multi-view learning based on product and process metrics for software defect prediction - researchr publication authors

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Ying Sun, Fei Wu 0004, Di Wu 0014, Xiao-Yuan Jing, Yanfei Sun. Multi-view learning based on product and process metrics for software defect prediction. Appl. Intell., 55(6):406, April 2025. [doi]

This author has not been identified. Look up 'Ying Sun' in GoogleThis author has not been identified. Look up 'Fei Wu 0004' in GoogleThis author has not been identified. Look up 'Di Wu 0014' in GoogleThis author has not been identified. Look up 'Xiao-Yuan Jing' in GoogleThis author has not been identified. Look up 'Yanfei Sun' in Google

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