Ying Sun, Fei Wu 0004, Di Wu 0014, Xiao-Yuan Jing, Yanfei Sun. Multi-view learning based on product and process metrics for software defect prediction. Appl. Intell., 55(6):406, April 2025. [doi]
@article{SunWWJS25,
title = {Multi-view learning based on product and process metrics for software defect prediction},
author = {Ying Sun and Fei Wu 0004 and Di Wu 0014 and Xiao-Yuan Jing and Yanfei Sun},
year = {2025},
month = {April},
doi = {10.1007/s10489-025-06288-6},
url = {https://doi.org/10.1007/s10489-025-06288-6},
researchr = {https://researchr.org/publication/SunWWJS25},
cites = {0},
citedby = {0},
journal = {Appl. Intell.},
volume = {55},
number = {6},
pages = {406},
}