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Bug Localization for Version Issues With Defect Patterns

Xiaobing Sun, Wei Zhou, Bin Li 0006, Zhen Ni, Jinting Lu. Bug Localization for Version Issues With Defect Patterns. IEEE Access, 7:18811-18820, 2019. [doi]

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Xiaobing Sun

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Wei Zhou

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Bin Li 0006

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Zhen Ni

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Jinting Lu

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