Bug Localization for Version Issues With Defect Patterns

Xiaobing Sun, Wei Zhou, Bin Li 0006, Zhen Ni, Jinting Lu. Bug Localization for Version Issues With Defect Patterns. IEEE Access, 7:18811-18820, 2019. [doi]

@article{SunZLNL19,
  title = {Bug Localization for Version Issues With Defect Patterns},
  author = {Xiaobing Sun and Wei Zhou and Bin Li 0006 and Zhen Ni and Jinting Lu},
  year = {2019},
  doi = {10.1109/ACCESS.2019.2894976},
  url = {https://doi.org/10.1109/ACCESS.2019.2894976},
  researchr = {https://researchr.org/publication/SunZLNL19},
  cites = {0},
  citedby = {0},
  journal = {IEEE Access},
  volume = {7},
  pages = {18811-18820},
}