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Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in Comparison With SiC MOSFETs

Jiahui Sun, Kailun Zhong, Zheyang Zheng, Gang Lyu, Kevin J. Chen. Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in Comparison With SiC MOSFETs. IEEE Transactions on Industrial Electronics, 69(7):7340-7348, 2022. [doi]

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