Impression estimation model and pattern search system based on style features and Kansei metric

Natsuki Sunda, Kensuke Tobitani, Atsushi Takemoto, Iori Tani, Yusuke Tani, Taishi Fujiwara, Noriko Nagata, Nobufumi Morita. Impression estimation model and pattern search system based on style features and Kansei metric. In Stephen N. Spencer, Shigeo Morishima, Yuichi Itoh, Takaaki Shiratori, Yonghao Yue, Robert Lindeman, editors, Proceedings of the 24th ACM Symposium on Virtual Reality Software and Technology, VRST 2018, Tokyo, Japan, November 28 - December 01, 2018. ACM, 2018. [doi]

Abstract

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