Gaeryun Sung, Jaeduk Han. High-speed StrongARM-latch-based Bang-bang Phase Detector in 40-nm CMOS Technology. In 18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021. pages 377-378, IEEE, 2021. [doi]
@inproceedings{SungH21-2,
title = {High-speed StrongARM-latch-based Bang-bang Phase Detector in 40-nm CMOS Technology},
author = {Gaeryun Sung and Jaeduk Han},
year = {2021},
doi = {10.1109/ISOCC53507.2021.9613931},
url = {https://doi.org/10.1109/ISOCC53507.2021.9613931},
researchr = {https://researchr.org/publication/SungH21-2},
cites = {0},
citedby = {0},
pages = {377-378},
booktitle = {18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021},
publisher = {IEEE},
isbn = {978-1-6654-0174-6},
}