Stephen K. Sunter, Aubin Roy. A selt-testing BOST for high-frequency PLLs, DLLs, and SerDes. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-8, IEEE, 2007. [doi]
Abstract is missing.