Vikram B. Suresh, Wayne P. Burleson. Robust metastability-based TRNG design in nanometer CMOS with sub-vdd pre-charge and hybrid self-calibration. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 298-305, IEEE, 2012. [doi]
@inproceedings{SureshB12,
title = {Robust metastability-based TRNG design in nanometer CMOS with sub-vdd pre-charge and hybrid self-calibration},
author = {Vikram B. Suresh and Wayne P. Burleson},
year = {2012},
doi = {10.1109/ISQED.2012.6187509},
url = {http://dx.doi.org/10.1109/ISQED.2012.6187509},
researchr = {https://researchr.org/publication/SureshB12},
cites = {0},
citedby = {0},
pages = {298-305},
booktitle = {Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012},
editor = {Keith A. Bowman and Kamesh V. Gadepally and Pallab Chatterjee and Mark M. Budnik and Lalitha Immaneni},
publisher = {IEEE},
isbn = {978-1-4673-1034-5},
}