Anmol Prakash Surhonne, Anupam Chattopadhyay, Robert Wille. Automatic Test Pattern Generation for Multiple Missing Gate Faults in Reversible Circuits - Work in Progress Report. In Iain Phillips, Hafizur Rahaman, editors, Reversible Computation - 9th International Conference, RC 2017, Kolkata, India, July 6-7, 2017, Proceedings. Volume 10301 of Lecture Notes in Computer Science, pages 176-182, Springer, 2017. [doi]
Abstract is missing.