Ketul B. Sutaria, Pengpeng Ren, Abinash Mohanty, Xixiang Feng, Runsheng Wang, Ru Huang, Yu Cao. Duty cycle shift under static/dynamic aging in 28nm HK-MG technology. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 7, IEEE, 2015. [doi]
Abstract is missing.