Einoshin Suzuki, Takeshi Watanabe, Hideto Yokoi, Katsuhiko Takabayashi. Detecting Interesting Exceptions from Medical Test Data with Visual Summarization. In Proceedings of the 3rd IEEE International Conference on Data Mining (ICDM 2003), 19-22 December 2003, Melbourne, Florida, USA. pages 315-322, IEEE Computer Society, 2003. [doi]
Abstract is missing.