Gate sizing: finFETs vs 32nm bulk MOSFETs

Brian Swahn, Soha Hassoun. Gate sizing: finFETs vs 32nm bulk MOSFETs. In Ellen Sentovich, editor, Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006. pages 528-531, ACM, 2006. [doi]

Authors

Brian Swahn

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Soha Hassoun

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