Madhavan Swaminathan, Bruce Kim, Abhijit Chatterjee. A Survey of Test Techniques for MCM Substrates. J. Electronic Testing, 10(1-2):27-38, 1997. [doi]
@article{SwaminathanKC97,
title = {A Survey of Test Techniques for MCM Substrates},
author = {Madhavan Swaminathan and Bruce Kim and Abhijit Chatterjee},
year = {1997},
doi = {10.1023/A:1008214330042},
url = {http://dx.doi.org/10.1023/A:1008214330042},
tags = {testing, survey},
researchr = {https://researchr.org/publication/SwaminathanKC97},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {10},
number = {1-2},
pages = {27-38},
}