Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen. Multiple-Bit-Flip Detection Scheme for a Soft-Error Resilient TCAM. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016. pages 679-684, IEEE, 2016. [doi]
Abstract is missing.