Reliability investigations on HBV using pulsed electrical stress

Cezary Sydlo, M. Saglam, Bastian Mottet, M. Rodríguez-Gironés, Hans L. Hartnagel. Reliability investigations on HBV using pulsed electrical stress. Microelectronics Reliability, 42(9-11):1563-1568, 2002. [doi]

Abstract

Abstract is missing.