Marek Sýs, Zdenek Ríha. Faster Randomness Testing with the NIST Statistical Test Suite. In Rajat Subhra Chakraborty, Vashek Matyas, Patrick Schaumont, editors, Security, Privacy, and Applied Cryptography Engineering - 4th International Conference, SPACE 2014, Pune, India, October 18-22, 2014. Proceedings. Volume 8804 of Lecture Notes in Computer Science, pages 272-284, Springer, 2014. [doi]
@inproceedings{SysR14, title = {Faster Randomness Testing with the NIST Statistical Test Suite}, author = {Marek Sýs and Zdenek Ríha}, year = {2014}, doi = {10.1007/978-3-319-12060-7_18}, url = {http://dx.doi.org/10.1007/978-3-319-12060-7_18}, researchr = {https://researchr.org/publication/SysR14}, cites = {0}, citedby = {0}, pages = {272-284}, booktitle = {Security, Privacy, and Applied Cryptography Engineering - 4th International Conference, SPACE 2014, Pune, India, October 18-22, 2014. Proceedings}, editor = {Rajat Subhra Chakraborty and Vashek Matyas and Patrick Schaumont}, volume = {8804}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-319-12059-1}, }