Marek Sýs, Zdenek Ríha. Faster Randomness Testing with the NIST Statistical Test Suite. In Rajat Subhra Chakraborty, Vashek Matyas, Patrick Schaumont, editors, Security, Privacy, and Applied Cryptography Engineering - 4th International Conference, SPACE 2014, Pune, India, October 18-22, 2014. Proceedings. Volume 8804 of Lecture Notes in Computer Science, pages 272-284, Springer, 2014. [doi]
Abstract is missing.