Piotr M. Szczypinski, Artur Klepaczko, Marcin Kociolek. Barley defects identification. In Stanislav Kovacic, Sven Loncaric, Matej Kristan, Vitomir Struc, Mladen Vucic, editors, Proceedings of the 10th International Symposium on Image and Signal Processing and Analysis, ISPA 2017, Ljubljana, Slovenia, September 18-20, 2017. pages 216-219, IEEE, 2017. [doi]
Abstract is missing.