Vladimir Székely, Márta Rencz. Thermal test and monitoring [microelectronic structures]. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 601, IEEE Computer Society, 1995. [doi]
@inproceedings{SzekelyR95,
title = {Thermal test and monitoring [microelectronic structures]},
author = {Vladimir Székely and Márta Rencz},
year = {1995},
doi = {10.1109/EDTC.1995.470328},
url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1995.470328},
researchr = {https://researchr.org/publication/SzekelyR95},
cites = {0},
citedby = {0},
pages = {601},
booktitle = {1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995},
publisher = {IEEE Computer Society},
isbn = {0-8186-7039-8},
}