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Gate-Level-Accurate Fault-Effect Analysis at Virtual-Prototype Speed

Bogdan-Andrei Tabacaru, Moomen Chaari, Wolfgang Ecker, Thomas Kruse, Cristiano Novello. Gate-Level-Accurate Fault-Effect Analysis at Virtual-Prototype Speed. In Amund Skavhaug, Jérémie Guiochet, Erwin Schoitsch, Friedemann Bitsch, editors, Computer Safety, Reliability, and Security - SAFECOMP 2016 Workshops, ASSURE, DECSoS, SASSUR, and TIPS, Trondheim, Norway, September 20, 2016, Proceedings. Volume 9923 of Lecture Notes in Computer Science, pages 144-156, Springer, 2016. [doi]

Authors

Bogdan-Andrei Tabacaru

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Moomen Chaari

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Wolfgang Ecker

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Thomas Kruse

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Cristiano Novello

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