Bogdan-Andrei Tabacaru, Moomen Chaari, Wolfgang Ecker, Thomas Kruse, Cristiano Novello. Gate-Level-Accurate Fault-Effect Analysis at Virtual-Prototype Speed. In Amund Skavhaug, Jérémie Guiochet, Erwin Schoitsch, Friedemann Bitsch, editors, Computer Safety, Reliability, and Security - SAFECOMP 2016 Workshops, ASSURE, DECSoS, SASSUR, and TIPS, Trondheim, Norway, September 20, 2016, Proceedings. Volume 9923 of Lecture Notes in Computer Science, pages 144-156, Springer, 2016. [doi]
@inproceedings{TabacaruCEKN16,
title = {Gate-Level-Accurate Fault-Effect Analysis at Virtual-Prototype Speed},
author = {Bogdan-Andrei Tabacaru and Moomen Chaari and Wolfgang Ecker and Thomas Kruse and Cristiano Novello},
year = {2016},
doi = {10.1007/978-3-319-45480-1_12},
url = {http://dx.doi.org/10.1007/978-3-319-45480-1_12},
researchr = {https://researchr.org/publication/TabacaruCEKN16},
cites = {0},
citedby = {0},
pages = {144-156},
booktitle = {Computer Safety, Reliability, and Security - SAFECOMP 2016 Workshops, ASSURE, DECSoS, SASSUR, and TIPS, Trondheim, Norway, September 20, 2016, Proceedings},
editor = {Amund Skavhaug and Jérémie Guiochet and Erwin Schoitsch and Friedemann Bitsch},
volume = {9923},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-319-45479-5},
}