Inversion of Subsurface Properties of Layered Dielectric Structures With Random Slightly Rough Interfaces Using the Method of Simulated Annealing

Alireza Tabatabaeenejad, Mahta Moghaddam. Inversion of Subsurface Properties of Layered Dielectric Structures With Random Slightly Rough Interfaces Using the Method of Simulated Annealing. IEEE T. Geoscience and Remote Sensing, 47(7-1):2035-2046, 2009. [doi]

Abstract

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