Learning statistically relevant edge structure improves low-level visual descriptors - researchr publication authors

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Domen Tabernik, Matej Kristan, Marko Boben, Ales Leonardis. Learning statistically relevant edge structure improves low-level visual descriptors. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 1471-1474, IEEE, 2012. [doi]

This author has not been identified. Look up 'Domen Tabernik' in GoogleThis author has not been identified. Look up 'Matej Kristan' in GoogleThis author has not been identified. Look up 'Marko Boben' in GoogleThis author has not been identified. Look up 'Ales Leonardis' in Google

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